Overview
A data foundation built for manufacturing quality
A global top-three PCB manufacturer serves the NVIDIA supply chain and other demanding compute-platform customers. High-layer-count and high-density products require AOI, AVI, electrical test, and review processes that generate large volumes of images, coordinates, logs, and defect evidence across factories.
Challenge
Inspection growth had outpaced line-side storage
As AI-server demand accelerated, independent equipment repositories made it difficult to trace a lot across process steps or compare defect evidence between sites. Storage growth was unpredictable, file naming varied by equipment vendor, and long directory scans delayed quality response.
- Rapid AI-server production growth increased both file count and the urgency of quality investigations.
- Equipment-specific directories obscured the relationship between inspection evidence and production context.
- Cross-site analysis required time-consuming manual copying and reconciliation.
Solution
One governed platform for the complete data lifecycle
Dataram IDM collects data directly from inspection and test equipment, normalizes key manufacturing metadata, and stores the resulting files in an elastic distributed namespace. Quality teams search by lot, panel, board, serial number, process, equipment, date, or defect type, while lifecycle policies move aging records to more economical storage.
Automated collection captures inspection files without changing the production rhythm.
A common metadata model enables multidimensional search across equipment brands and sites.
Elastic capacity and lifecycle tiering align storage cost with data age and business value.
Results
Measurable value at production scale
The manufacturer replaces manual directory searches with a consistent seconds-level traceability workflow. Multi-site data becomes visible through one governed interface, storage can expand without re-architecting the line, and selected historical records can be prepared for defect analytics and AI model iteration.
- Seconds-level retrieval replaces manual folder scans during quality traceability.
- One governed view improves collaboration across plants and customer-response teams.
- Historical inspection evidence becomes reusable for analytics and AI-assisted quality improvement.
Customer identity and selected implementation details have been anonymized to protect confidentiality. No source diagrams or architecture images are reproduced in this article.
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